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专利名称：OPTICAL MEASUREMENT OF A
COMPONENT HAVING STRUCTURALFEATURES PRESENT AT OPPOSITE SIDES
发明人：Norbert HEILMANN申请号：US14616815申请日：20150209
公开号：US20150237309A1公开日：20150820
专利附图：
摘要：A method for mounting an electronic component () onto a component carrier ()is described. The method comprises (a) optically capturing a first image from a first side
of the component (), at which first side a first structural feature () of the component () isdiscernible, by means of a first camera (), (b) optically capturing a second image from asecond side of the component (), at which second side a second structural feature () ofthe component () is discernible, by means of a second camera (), wherein the first side andthe second side are situated opposite one another and wherein the second structuralfeature () is configured to be connected at a predetermined position on the componentcarrier (), (c) orienting the electronic component () such that a center of the first
structural feature () is aligned with a desired position relative to the component carrier (),wherein the second structural feature () can be correspondingly offset from thepredetermined position, and (d) mounting the electronic component () onto thecomponent carrier (), wherein the center of the first structural feature () is alignedrelative to the component carrier (), wherein the second structural feature () is offsetfrom the predetermined position. Moreover, a method for checking the functionality ofan optoelectronic component in advance of a population of a component carrier and anautomatic placement machine for mounting an optically measured electronic componentare also described.
申请人：ASM Assembly Systems GmbH & Co. KG
地址：Munich DE
国籍：DE
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