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专利名称：Device for measurement and analysis of
electrical signals of an integrated circuitcomponent
发明人：Wilhelm Schmid,Carsten Dorrhofer申请号：US11397754申请日：20060404
公开号：US20060176066A1公开日：20060810
专利附图：
摘要：According to the invention, one or more external test connection contact points(pads; pins; balls), are provided in an integrated circuit component (chip) (), through which
signals () that are to be measured or analyzed are selectively fed, e.g. by means of amultiplex circuit (), and wherein the signals may be connected by means of routes locatedinternally in the component from switch points that are not directly accessible, e.g. pointsinside the chip (to ) or covered contact points. The device according to the invention isparticularly useful for highly integrated semiconductor chips.
申请人：Wilhelm Schmid,Carsten Dorrhofer
地址：Ingolstadt DE,Holzkirchen DE
国籍：DE,DE
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