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A method of and an arrangement for testing connect

来源:微智科技网
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专利名称:A method of and an arrangement for testing

connections on a printed circuit board

发明人:Van den Eijnden, Petrus Marinus Cornelis

Maria

申请号:EP10190550.3申请日:20101109公开号:EP2320241A1公开日:20110511

专利附图:

摘要:A method of and an arrangement for testing connections on a printed circuitboard between boundary-scan compliant circuit terminals of one or more boundary-scan

compliant devices. By an electronic processing unit, boundary-scan properties of the oreach boundary-scan compliant device are retrieved (45), a list comprising boundary-scancompliant circuit terminals is displayed (46), and a selection of at least a first and secondcircuit terminal is received (47). Based on this selection, a boundary-scan cell of a firstcircuit terminal is operated as a driver (48) and a boundary-scan cell of a second circuitterminal is operated as a sensor (49). The driver and sensor data are analyzed (52) for aconnection between the first and the second circuit terminals and the result of theanalyses is presented (53).

申请人:JTAG Technologies B.V.

地址:Boschdijk 50 5612 AN Eindhoven NL

国籍:NL

代理机构:Algemeen Octrooi- en Merkenbureau

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