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专利名称：Device for measuring mechanical
parameters, method for measuringmechanical parameters and use of a devicefor measuring mechanical parameters
发明人：SCHEIDL, ANDREAS, DIPL., ING.,SCHMID,
JOSEF, MAG.,BURKHARDT, AXEL, DIPL.,ING.,SCHNEIDER, KLAUS, DR. , DIPL., ING.
申请号：EP08015406.5申请日：20080901公开号：EP2037249A2公开日：20090318
专利附图：
摘要：The device (10) has a pair of recess (12) for receiving a unit and the unit isforcefully introduced in the device. The unit is not completely enclosed in the recess. Twoopposite former recesses are located in connection with another recess (16) and form acommon recess. The former recesses are circular shaped. The common recess formed bythe former and latter recesses has a round contour. An independent claim is included fora method for measuring mechanical quantities.
申请人：LIEBHERR-WERK NENZING GMBH
地址：Dr.-Hans-Liebherr-Strasse 1 6710 Nenzing AT
国籍：AT
代理机构：Laufhütte, Dieter
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