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专利名称：Method for sorting integrated circuit
devices
发明人：Raymond J. Beffa申请号：US09653101申请日：20000831公开号：US06307171B1公开日：20011023
专利附图：
摘要：An inventive method for sorting integrated circuit (IC) devices of the type havinga substantially unique identification (ID) code, such as a fuse ID, includes automaticallyreading the ID code of each of the IC devices and sorting the IC devices in accordance
with their automatically read ID codes. The inventive method can be used in conjunctionwith an IC manufacturing process that includes providing semiconductor wafers,fabricating the IC's on each of the wafers, causing each of the IC's to store its ID code,separating each of the IC's from its wafer to form IC dice, assembling the IC dice into ICdevices, and testing the IC devices. The inventive method is useful for, among otherthings, culling IC reject bins for shippable IC's, sorting IC's from a wafer lot into thosethat require enhanced reliability testing and those that do not, and allowing IC'sfabricated using both a control fabrication process recipe and a new fabrication processrecipe under test to be assembled and tested using the same equipment to reduceunintended test variables introduced when the IC's are assembled and tested separately.
申请人：MICRON TECHNOLOGY, INC.
代理机构：TraskBritt
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