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Device and method for the examination of samples i

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专利内容由知识产权出版社提供

专利名称:Device and method for the examination of

samples in a non vacuum environment usinga scanning electron microscope

发明人:Elisha Moses,Ory Zik,Stephan Thiberge申请号:US10841769申请日:20040506

公开号:US20040217297A1公开日:20041104

专利附图:

摘要:A chamber suitable for use with a scanning electron microscope. The chambercomprises at least one aperture sealed with a membrane. The membrane is adapted to

withstand a vacuum, and is transparent to electrons and the interior of the chamber isisolated from said vacuum. The chamber is useful for allowing wet samples includingliving cells to be viewed under an electron microscope.

申请人:YEDA RESEARCH AND DEVELOPMENT CO. LTD.,EL-MUL TECHNOLOGIES LTD.

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