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专利名称：SEMICONDUCTOR APPARATUS AND
DISPLAY APPARATUS
发明人：Takuya Ito,Koji Shimizu申请号：US154602申请日：20170321
公开号：US20170277586A1公开日：20170928
专利附图：
摘要：According to an aspect, a semiconductor apparatus includes semiconductordevices. Each semiconductor device includes: a state monitor that monitors a plurality offunctions implemented by the semiconductor device, and outputs state monitoring
signals; and an anomaly determination circuit that performs anomaly determinationbased on the state monitoring signals. When the anomaly determination circuit of a firstsemiconductor device detects that one or more of the functions of the semiconductordevices are abnormal based on a first anomaly determination result and a secondanomaly determination result, the anomaly determination circuit of the first
semiconductor device outputs an anomaly detection signal to the semiconductor devices.The first anomaly determination result is a result of the anomaly determinationperformed on the functions of the first semiconductor device, and the second anomalydetermination result is a result of the anomaly determination performed on thefunctions of a second semiconductor device.
申请人：Japan Display Inc.
地址：Tokyo JP
国籍：JP
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