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CMOS image sensor and method for fabricating the s

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专利内容由知识产权出版社提供

专利名称:CMOS image sensor and method for

fabricating the same

发明人:Hwang Joon申请号:US11448428申请日:20060607

公开号:US20060273349A1公开日:20061207

专利附图:

摘要:A CMOS image sensor and a method of fabricating the same are provided. TheCMOS image sensor includes: an epitaxial layer of a first conductivity type, formed in asemiconductor substrate of the first conductivity type; a blue photodiode region of a

second conductivity type, formed in the epitaxial layer at a first depth; a greenphotodiode region of the second conductivity type, spaced apart from the bluephotodiode region and formed in the epitaxial layer at a second depth larger than thefirst depth; and a red photodiode region of the second conductivity type, spaced apartfrom the green photodiode region and formed in the epitaxial layer at a third depthlarger than the second depth.

申请人:Hwang Joon

地址:Cheongju-si KR

国籍:KR

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