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专利名称:CMOS image sensor and method for
fabricating the same
发明人:Hwang Joon申请号:US11448428申请日:20060607
公开号:US20060273349A1公开日:20061207
专利附图:
摘要:A CMOS image sensor and a method of fabricating the same are provided. TheCMOS image sensor includes: an epitaxial layer of a first conductivity type, formed in asemiconductor substrate of the first conductivity type; a blue photodiode region of a
second conductivity type, formed in the epitaxial layer at a first depth; a greenphotodiode region of the second conductivity type, spaced apart from the bluephotodiode region and formed in the epitaxial layer at a second depth larger than thefirst depth; and a red photodiode region of the second conductivity type, spaced apartfrom the green photodiode region and formed in the epitaxial layer at a third depthlarger than the second depth.
申请人:Hwang Joon
地址:Cheongju-si KR
国籍:KR
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