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专利名称：TEST SYSTEM AND TEST METHOD发明人：Kazuhiro IIZUKA,Kohei NOMA申请号：US14672418申请日：20150330
公开号：US20150279015A1公开日：20151001
专利附图：
摘要：According to an embodiment, A test system includes: a moving unit configuredto move a test object, the test object including a first surface, a mark being printed onthe first surface; a first imaging device configured to photograph the first surface of testobject to obtain a first image; a cutter configured to scratch the first surface; a first unit
configured to attach a tape to the first surface; a second unit configured to detach thetape from the first surface; a second imaging device configured to photograph the firstsurface after detaching the tape to obtain a second image; and a controller configured tocompare the first image and the second image to output a comparison result.
申请人：Kabushiki Kaisha Toshiba
地址：Minato-ku JP
国籍：JP
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